Armen V. Sogoyan - Concepedia

Author

Armen V. Sogoyan

National Research Nuclear University MEPhI ORCID

Also Known As

A V Sogoyan, A. Sogoyan, A. V. Sogoyan, A.V Sogoyan, A.V. Sogoyan, A.V. Ulanova, Armen Sogoyan, Armen V. Sogoyan

Publications

476

Citations

H-Index

Concepts

All Affiliations

National Research Nuclear University MEPhI Institute of Engineering Physics Russian Space Systems Research Institute of Precision Instruments (Russia)Joint Stock Company National Research Institute Electron

About

Armen V. Sogoyan is an author at National Research Nuclear University MEPhI specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	12	273
2	Applied Physics	7	7	178
3	Health Sciences	4	4	85
4	Education	1	1	20
5	Medicine	1	1	23

Armen V. Sogoyan

Publications

356

Citations

H-Index

Page 1

	Year	Citations
The effect of emitter junction bias on the low dose-rate radiation response of bipolar devices V.B. Maslov, S.V. Cherepko, I.N. Shvetzov-Shilovsky, IEEE Transactions on Nuclear Science Device ModelingExperimental ResultsElectrical EngineeringBipolar DevicesEngineering	1997	50
Radiation Response of Bipolar Transistors at Various Irradiation Temperatures and Electric Biases: Modeling and Experiment Gennady I. Zebrev, D.Y. Pavlov, A.Y. Nikiforov, IEEE Transactions on Nuclear Science Device ModelingElectrical EngineeringBipolar TransistorsEnhanced YieldPhysics	2006	31
Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM Anna B. Boruzdina, Armen V. Sogoyan, Anatoly A. Smolin, IEEE Transactions on Nuclear Science Electrical EngineeringEngineeringVlsi DesignPhysicsHardware Reliability	2015	30
Method for integrated circuits total ionizing dose hardness testing based on combined gamma- and x-ray irradiation facilities Armen V. Sogoyan, Alexander Y. Nikiforov, Dmitry V. Boychenko Facta universitatis - series Electronics and Energetics Radiation ExposureRadiation ProtectionRadiation TestingCombined TestingBalanced Combination	2014	23
Compendium of SEE comparative results under ion and laser irradiation A. I. Chumakov, Alexander Pechenkin, D. V. Savchenkov, Ion ImplantationEngineeringSegr Comparative ResultsLaser ApplicationsIon Beam	2013	22
Modeling the field and thermal dependence of radiation-induced charge annealing in MOS devices Armen V. Sogoyan, O.V. Meshurov, V.N. Ulimov IEEE Transactions on Nuclear Science EngineeringThermal DependenceThermal DependenciesSilicon On InsulatorSemiconductor Device	1996	21
Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review V.V. Belyakov, Gennady I. Zebrev, Armen V. Sogoyan, Russian Microelectronics	2003	21
Automated I&#x2013;V measurement system for CMOS SOI transistor test structures Ivan I. Shvetsov-Shilovskiy, Pavel V. Nekrasov, Anastasia V. Ulanova, Electrical EngineeringEngineeringVlsi DesignCircuit SystemMeasurement	2015	20
IC’s radiation effects modeling and estimation V.V. Belyakov, A. I. Chumakov, A.Y. Nikiforov, Microelectronics Reliability EngineeringHealth SciencesRadiation MonitoringRadiation MeasurementRadiation Transport	2000	20
Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation Leonid N. Kessarinskiy, Dmitry V. Boychenko, Andrey G. Petrov, EngineeringRadiation DetectionTid InvestigationsHealth SciencesLinac Irradiation	2014	20

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