S.V. Cherepko

Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches

Xiaobin Yuan, S.V. Cherepko, James C. M. Hwang et al. · 2004 · 89 citations

Capacitance Voltage, Electrical Engineering, Dielectrics +15

The effect of emitter junction bias on the low dose-rate radiation response of bipolar devices

V.B. Maslov, S.V. Cherepko, I.N. Shvetzov-Shilovsky et al. · IEEE Transactions on Nuclear Science · 1997 · 50 citations

Device Modeling, Experimental Results, Electrical Engineering +14

Proposed two-level Acceptor-Donor (AD) center and the nature of switching traps in irradiated MOS structures

S.V. Cherepko, Armen V. Sogoyan, V.V. Belyakov et al. · IEEE Transactions on Nuclear Science · 1996 · 20 citations

Ii-vi Semiconductor, Transition Metal Chalcogenides, Electrical Engineering +14

VBIC model applicability and extraction procedure for InGap/GaAs HBT

S.V. Cherepko, James C. M. Hwang · 2002 · 18 citations

Device Modeling, Electrical Engineering, Saturation Currents +14

Three-point method of prediction of MOS device response in space environments

V.V. Belyakov, S.V. Cherepko, I.N. Shvetzov-Shilovsky · IEEE Transactions on Nuclear Science · 1993 · 18 citations

Engineering, Electromagnetic Compatibility, Semiconductor Device +22