Pavel V. Nekrasov

Total ionizing dose effects and radiation testing of complex multifunctional VLSI devices

Dmitry V. Boychenko, O. A. Kalashnikov, Alexander Y. Nikiforov et al. · Facta universitatis - series Electronics and Energetics · 2015 · 30 citations · Full text

Total Ionizing Dose, Engineering, Vlsi Design +17

System on module total ionizing dose distribution modeling

Alexey O. Akhmetov, Dmitry V. Boychenko, D. V. Bobrovskiy et al. · 2014 · 28 citations

Engineering, Physics, Medicine +14

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

O. A. Kalashnikov, Pavel V. Nekrasov, Alexander Y. Nikiforov et al. · Russian Microelectronics · 2016 · 24 citations

Compendium of SEE comparative results under ion and laser irradiation

A. I. Chumakov, Alexander Pechenkin, D. V. Savchenkov et al. · 2013 · 22 citations

Ion Implantation, Engineering, Segr Comparative Results +12

Automated I–V measurement system for CMOS SOI transistor test structures

Ivan I. Shvetsov-Shilovskiy, Pavel V. Nekrasov, Anastasia V. Ulanova et al. · 2015 · 20 citations

Electrical Engineering, Engineering, Vlsi Design +15