Facta universitatis - series Electronics and Energetics · 2015 · 30 citations · 24 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSystem-on-chip DesignVlsi DesignBuilt-in Self-testDesign For TestabilityDevice CharacterizationHigh-dose Radiation EffectsIntegrated Circuit DesignIntegrated Circuit DevicesComponent-level Radiation TestingRadiation Dose EffectsRadiation EffectsRadiation TestingRadiation-hard DevicesTotal Ionizing Dose EffectsVery-large-scale IntegrationVery-large-scale Integration (Vlsi) Design
Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional ?simple? ICs. The main difficulty is to organize informative and quick functional tests directly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples.
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