O. A. Kalashnikov

TID behavior of complex multifunctional VLSI devices

O. A. Kalashnikov, Alexander Y. Nikiforov · 2014 · 32 citations

Total ionizing dose effects and radiation testing of complex multifunctional VLSI devices

Dmitry V. Boychenko, O. A. Kalashnikov, Alexander Y. Nikiforov et al. · Facta universitatis - series Electronics and Energetics · 2015 · 30 citations · Full text

Total Ionizing Dose, Engineering, Vlsi Design +17

System on module total ionizing dose distribution modeling

Alexey O. Akhmetov, Dmitry V. Boychenko, D. V. Bobrovskiy et al. · 2014 · 28 citations

Engineering, Physics, Medicine +14

"REIS-IE" X-ray tester: description, qualification technique and results, dosimetry procedure

A. I. Chumakov, V. V. Eremin, I. Figurov et al. · 2002 · 24 citations

Radiation Exposure, Radiation Protection, X-ray Imaging +18

System-on-chip: Specifics of radiation behavior and estimation of radiation hardness

O. A. Kalashnikov, Pavel V. Nekrasov, Alexander Y. Nikiforov et al. · Russian Microelectronics · 2016 · 24 citations