O. A. Kalashnikov - Concepedia

Author

O. A. Kalashnikov

National Research Nuclear University MEPhI ORCID

Also Known As

O. A. Kalashnikov, O. Kalashnikov, O.A. Kalashnikov, Oleg A. Kalashnikov, Oleg Kalashnikov

Publications

287

Citations

H-Index

Concepts

All Affiliations

National Research Nuclear University MEPhI

About

O. A. Kalashnikov is an author at National Research Nuclear University MEPhI specializing in engineering, electrical engineering, and computer engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	115
2	Computer Engineering	5	5	105
3	Electrical Engineering	5	5	87
4	Medicine	3	3	82
5	Health Sciences	2	2	42

O. A. Kalashnikov

Publications

247

Citations

H-Index

Page 1

	Year	Citations
TID behavior of complex multifunctional VLSI devices O. A. Kalashnikov, Alexander Y. Nikiforov	2014	32
Total ionizing dose effects and radiation testing of complex multifunctional VLSI devices Dmitry V. Boychenko, O. A. Kalashnikov, Alexander Y. Nikiforov, Facta universitatis - series Electronics and Energetics Total Ionizing DoseEngineeringVlsi DesignDose EffectsIntegrated Circuits	2015	30
System on module total ionizing dose distribution modeling Alexey O. Akhmetov, Dmitry V. Boychenko, D. V. Bobrovskiy, EngineeringPhysicsMedicineSpecialized Electronic SystemsRadiation Dose	2014	28
"REIS-IE" X-ray tester: description, qualification technique and results, dosimetry procedure A. I. Chumakov, V. V. Eremin, I. Figurov, Radiation ExposureRadiation ProtectionX-ray ImagingRadiation TestingCalibration	2002	24
System-on-chip: Specifics of radiation behavior and estimation of radiation hardness O. A. Kalashnikov, Pavel V. Nekrasov, Alexander Y. Nikiforov, Russian Microelectronics	2016	24
An estimate of the FPGA sensitivity to effects of single nuclear particles D. V. Bobrovskii, O. A. Kalashnikov, Pavel V. Nekrasov Russian Microelectronics	2012	19
Integrating analog-to-digital converter radiation hardness test technique and results O. A. Kalashnikov, V.S. Figurov, A.Y. Nikiforov, IEEE Transactions on Nuclear Science EngineeringTotal DoseAnalog DesignRadiation ExposureElectromagnetic Compatibility	1998	18
Rational methodological approach to evaluation of dose resistance of CMOS microcircuits with respect to low intensity effects Dmitry V. Boychenko, O. A. Kalashnikov, Andrey B. Karakozov, Russian Microelectronics	2015	17
Using modules NI PXI-7841R rapid I/O modulefor the functional control of the microprocessors Vladimir A. Marfin, Pavel V. Nekrasov, O. A. Kalashnikov, EngineeringVlsi DesignComputer ArchitectureProcessor ArchitectureHardware Architecture	2015	16
Functional checks of microprocessors during radiation tests Pavel V. Nekrasov, O. A. Kalashnikov Instruments and Experimental Techniques	2009	16

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