IEEE Transactions on Nuclear Science · 2015 · 32 citations · 24 references
EngineeringMaterials ScienceNuclear EngineeringNuclear PhysicsRadiation MeasurementRadiation PhysicsCross Section DataDevice CharacterizationDevice ReliabilityNuclear Cross SectionsRadiation HardeningSemiconductor ReliabilityComponent-level Radiation TestingEnergy DependenceRadiation EffectsRadiation HardnessRadiation-hard DevicesSingle Event Upset Modeling
This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.
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