J. Baggio

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

V. Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin et al. · IEEE Transactions on Nuclear Science · 2006 · 151 citations

Engineering, Nuclear Physics, Vlsi Design +22

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2007 · 151 citations

Electrical Engineering, Single Event Transients, Engineering +12

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 2007 · 121 citations

Nuclear Interactions, Electrical Engineering, Single-event Upset +12

Effects of particle energy on proton-induced single-event latchup

J.R. Schwank, M.R. Shaneyfelt, J. Baggio et al. · IEEE Transactions on Nuclear Science · 2005 · 111 citations

Proton Interactions, Electrical Engineering, Engineering +13

Radiation Effects on Silica-Based Preforms and Optical Fibers—I: Experimental Study With Canonical Samples

S. Girard, Y. Ouerdane, G. Origlio et al. · IEEE Transactions on Nuclear Science · 2008 · 96 citations

Optical Materials, X-ray Spectroscopy, Engineering +21