J. Baggio

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

V. Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin et al. · IEEE Transactions on Nuclear Science · 2006 · 153 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow et al. · IEEE Transactions on Nuclear Science · 2007 · 152 citations

Engineering, Electrical Engineering, Microelectronics +14

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 2007 · 123 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

Effects of particle energy on proton-induced single-event latchup

J.R. Schwank, M.R. Shaneyfelt, J. Baggio et al. · IEEE Transactions on Nuclear Science · 2005 · 111 citations

Natural Sciences, Nuclear Engineering, Physics +14

Radiation Effects on Silica-Based Preforms and Optical Fibers—I: Experimental Study With Canonical Samples

S. Girard, Y. Ouerdane, G. Origlio et al. · IEEE Transactions on Nuclear Science · 2008 · 96 citations

Natural Sciences, Materials Engineering, Materials Science +17