Microelectronics Reliability · 2002 · 27 citations · 21 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignCmos Circuit DesignDevice CharacterizationHigh-frequency Semiconductor DevicesIntegrated Circuit DesignIntegrated Circuit DevicesShort-channel EffectsGate Grounded Diode ProtectionOn-chip Electrostatic Discharge ProtectionPolysiliconRf Cmos Design
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