Concepedia

A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains

Horst Gieser, Heinrich Wolf, Wolfgang Soldner, H. Reichl, A. Andreini, M. Natarajan, Wolfgang Stadler

Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 2003 · 14 citations · 6 references

Concepts

EngineeringElectrical EngineeringCircuit TheoryInstrumentationDevice CharacterizationElectrical MeasurementElectrical MetrologyElectrical System TestingFrequency Domain ProcessingFrequency-domain Circuit AnalysisFrequency-domain Circuit Modeling

Abstract

A traceable low-voltage network analysis in the time and frequency domain is introduced for the arcfree characterization of CDM testers and their metrology chains. An improved tester circuit model is derived from step responses.

References

6

Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms

Sven P. Bönisch, David Pommerenke, Wilfried Kalkner · Journal of Electrostatics · 2002 · 38 citations

Engineering, Electrical Engineering, Physics +7

Capacitively coupled transmission line pulsing cc-TLP––a traceable and reproducible stress method in the CDM-domain

Heinrich Wolf, Horst Gieser, Wolfgang Stadler et al. · Microelectronics Reliability · 2004 · 34 citations

Engineering, Electrical Engineering, Circuit Theory +13

Electrostatic Discharge Failures of Semiconductor Devices

B. A. Unger · Reliability physics · 1981 · 32 citations

Engineering, Electrical Engineering, Electrochemistry +12

Electrical characterisation of a power SO-package in the context of electrostatic discharge

I. Doerr, Horst Gieser, Grit Sommer et al. · 2003 · 15 citations

Engineering, Electrical Engineering, Circuit Theory +16

Charged device model (CDM) metrology: limitations and problems

L. Henry, H. Hyatt, Jon Barth et al. · 2005 · 12 citations

Engineering, Electrical Engineering, Instrumentation +8