Heinrich Wolf

Analysis of lateral DMOS power devices under ESD stress conditions

M. Mergens, W. Wilkening, S. Mettler et al. · IEEE Transactions on Electron Devices · 2000 · 124 citations

Engineering, Electrical Engineering, Microelectronics +16

Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions

M. Mergens, W. Wilkening, S. Mettler et al. · 2003 · 44 citations

Engineering, Electrical Engineering, Microelectronics +16

Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate coupling behavior

M. Mergens, W. Wilkening, S. Mettler et al. · 2003 · 42 citations

Engineering, Electrical Engineering, Circuit Theory +16

Capacitively coupled transmission line pulsing cc-TLP––a traceable and reproducible stress method in the CDM-domain

Heinrich Wolf, Horst Gieser, Wolfgang Stadler et al. · Microelectronics Reliability · 2004 · 34 citations

Engineering, Electrical Engineering, Circuit Theory +13

Characterization and modeling of transient device behavior under CDM ESD stress

Joost Willemen, A. Andreini, V. De Heyn et al. · Journal of Electrostatics · 2004 · 30 citations

Engineering, Electrical Engineering, Electronic Materials +12