MRS Proceedings · 2000 · 25 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceMetallic MaterialsMetallurgyThin FilmsAlloysCrystallization AnalysisMetal CastingMetalsThin-film MaterialsElectroplated MaterialsMetal Thin FilmsRecrystallizationRecrystallization BehaviorRecrystallization Microstructures
10
Electromigration path in Cu thin-film lines
C.‐K. Hu, R. Rosenberg, K. Y. Lee · Applied Physics Letters · 1999 · 329 citations
Natural Sciences, Materials Engineering, Materials Science +17