E. Richard

28nm FDSOI technology platform for high-speed low-voltage digital applications

N. Planes, O. Weber, V. Barral et al. · 2012 · 422 citations

Engineering, Vlsi Design, Emerging Memory Technology +16

Self-annealing characterization of electroplated copper films

Sébastien Lagrange, Sywert Brongersma, Moshe Judelewicz et al. · Microelectronic Engineering · 2000 · 163 citations

Materials Engineering, Materials Science, Electrical Engineering +6

Two-step room temperature grain growth in electroplated copper

Sywert Brongersma, E. Richard, I. Vervoort et al. · Journal of Applied Physics · 1999 · 95 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +16

14nm FDSOI technology for high speed and energy efficient applications

O. Weber, E. Josse, F. Andrieu et al. · 2014 · 89 citations

Low-power Electronics, Electrical Engineering, Engineering +9

Truly Innovative 28nm FDSOI Technology for Automotive Micro-Controller Applications embedding 16MB Phase Change Memory

F. Arnaud, P. Zuliani, J.-P. Reynard et al. · 2018 · 72 citations

Non-volatile Memory, Electrical Engineering, Engineering +14