IEEE Transactions on Electron Devices · 1994 · 47 citations · 24 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesCircuit SwitchingDc-ac InvertersDevice CharacterizationDevice ModelingDevice SimulationIntegrated Circuit DesignBand Tail StatesEffective Temperature DeterminationInverter ModelingInverter SystemsSwitching Activity AnalysisThreshold VoltageThreshold Voltage ExtractionThreshold Voltage Modeling
This paper presents an analytical a-Si:H DC/capacitance model using an effective temperature approach for deriving a switching time model for an inverter circuit considering deep and tail states. Using an effective temperature approach, the localized deep and tail states have been considered in the DC/capacitance model and the switching time model. As verified by the published data, the analytical DC/capacitance model provides an accurate prediction. Based on the analytical model, the threshold voltage of an a-Si:H TFT is proportional to the deep state density and the switching time of the TFT-inverter is dependent on the tail state density.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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