IEEE Transactions on Electron Devices · 1986 · 22 citations · 8 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSemiconductor DevicesBipolar Junction TransistorsCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyIntegrated Circuit DesignIntegrated Circuit DevicesMetal-oxide-semiconductor Field-effect TransistorsCmos Analog Integrated CircuitsCmos ScalingCurrent DensitySwitching Behavior
A novel high-voltage transistor structure, the insulated base transistor (IBT), based on a merged MOS-bipolar concept, ie described. This device, which can be implemented using a standard CMOS process, is capable of handling high current densities without latching. The IBT exhibits a fivefold increase in current density compared to the lateral DMOS. A simple technique by which the switching speeds of the IBT can be improved by almost an order of magnitude without significantly compromising its current carrying capability is also presented.
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The COMFET—A new high conductance MOS-gated device
John P. Russell, Alvin M. Goodman, L.A. Goodman et al. · IEEE Electron Device Letters · 1983 · 201 citations
The insulated gate rectifier (IGR): A new power switching device
B. Jayant Baliga, M.S. Adler, P. Gray et al. · 1982 · 199 citations
M. Darwish · Electronics Letters · 1984 · 73 citations
Analysis of the lateral insulated gate transistor
M. Simpson, P.A. Gough, F. I. Hshieh et al. · 1985 · 44 citations