Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> Total ionizing dose (TID) strongly affects the Single Event Transient (SET) sensitivity of a bipolar linear voltage comparator (LM139). </para>