J.-R. Vaillé

Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER

T. Mérelle, H. Chabane, J.M. Palau et al. · IEEE Transactions on Nuclear Science · 2005 · 74 citations

Engineering, Computer Engineering, Electrical Engineering +17

Real-time fibre optic radiation dosimeters for nuclear environment monitoring around thermonuclear reactors

Alberto Fernández, B. Brichard, Sinéad O’Keeffe et al. · Fusion Engineering and Design · 2007 · 67 citations

Engineering, Nuclear Engineering, Nuclear Instrumentation +15

Conception of an integrated sensor for the radiation monitoring of the CMS experiment at the large hadron collider

Federico Ravotti, M. Gläser, M. Moll et al. · IEEE Transactions on Nuclear Science · 2004 · 46 citations · Full text

Engineering, Nuclear Engineering, Physics +17

Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments

J. Boch, F. Saigne, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2005 · 44 citations

Engineering, Electrical Engineering, Circuit Theory +15

Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

M. F. Bernard, L. Dusseau, S. Büchner et al. · IEEE Transactions on Nuclear Science · 2007 · 39 citations

Medicine, Radiation Oncology, Radiation Detection +7