J.-R. Vaillé

Criterion for SEU occurrence in SRAM deduced from circuit and device Simulations in case of neutron-induced SER

T. Mérelle, H. Chabane, J.M. Palau et al. · IEEE Transactions on Nuclear Science · 2005 · 73 citations

Engineering, Seu Occurrence, Ion Implantation +18

Real-time fibre optic radiation dosimeters for nuclear environment monitoring around thermonuclear reactors

Alberto Fernández, B. Brichard, Sinéad O’Keeffe et al. · Fusion Engineering and Design · 2007 · 65 citations

Nuclear Environment, Radiation Detection, Nuclear Engineering +9

Conception of an integrated sensor for the radiation monitoring of the CMS experiment at the large hadron collider

Federico Ravotti, M. Gläser, M. Moll et al. · IEEE Transactions on Nuclear Science · 2004 · 46 citations · Full text

Electrical Engineering, Radiation Testing, Engineering +15

Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments

J. Boch, F. Saigne, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science · 2005 · 44 citations

Electrical Engineering, Low-dose-rate Irradiation, Engineering +14

Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

M. F. Bernard, L. Dusseau, S. Büchner et al. · IEEE Transactions on Nuclear Science · 2007 · 39 citations

Electrical Engineering, Total Ionizing Dose, Engineering +9