IEEE Journal of Solid-State Circuits · 1988 · 58 citations · 5 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice SimulationMicrowave Integrated CircuitsMicrowave Semiconductor DevicesSmall-signal AnalysisElectric Circuit ModelsFrequency Dependence Of ResistanceLarge-signal Device ModelingLarge-signal ModelingLow-frequency ModelingSmall-signal Device ModelingSmall-signal ModelingTransistor Small-signal Modeling
GaAs MESFETs exhibit low-frequency anomalies which effect the performance of broadband systems. A four-terminal large-signal GaAs MESFET circuit model which predicts may of the low-frequency anomalies discovered in GaAS MESFETs is proposed. The four-terminal model accurately models 'drain lag', frequency dependence of the output resistance, and hysteresis. This model when implemented in a circuit analysis program will enable circuit designs to predict which circuit topologies will be more or less sensitive to the GaAs low-frequency anomalies.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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RF Nonlinear Device Characterization Yields Improved Modeling Accuracy
Martin A. Smith, T.S. Howard, Kendra Anderson et al. · 2005 · 38 citations