CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing

Arithmetic coding for data compression

Ian H. Witten, Radford M. Neal, John G. Cleary · Communications of the ACM · 1987 · 2.9K citations · Full text

Engineering, Computer Engineering, Computer Science +13

Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen · Journal of Electronic Testing · 2002 · 404 citations

Engineering, Computer Engineering, Computer Science +14

A structured and scalable mechanism for test access to embedded reusable cores

Erik Jan Marinissen, R. Arendsen, G. G. J. Bos et al. · 2002 · 344 citations

Engineering, Computer Engineering, Computer Science +14

Test vector decompression via cyclical scan chains and its application to testing core-based designs

Abhijit Jas, Nur A. Touba · 2002 · 274 citations

Engineering, Computer Engineering, Computer Science +17

Scan vector compression/decompression using statistical coding

Abhijit Jas, J. Ghosh-Dastidar, Nur A. Touba · 2003 · 265 citations

Engineering, Computer Engineering, Computer Science +16