Concepedia

Embedded System Testing

Embedded System Testing is a systematic validation process within the domain of Microcontroller-Based Design that verifies the functional correctness, reliability, and performance of embedded systems under constrained hardware and real-time operational conditions.

709

Publications

22.9K

Citations

1.8K

Authors

595

Institutions

Publications per year

2017–2026

100

Parents

Publications

709

Testing embedded-core based system chips

Y. Zorian, Erik Jan Marinissen, S. Dey · 2002 · 427 citations

, , +15

Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip

Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan Marinissen · Journal of Electronic Testing · 2002 · 404 citations

, , +14

System-on-a-chip test-data compression and decompression architectures based on Golomb codes

Anshuman Chandra, Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2001 · 366 citations

, , +16

A structured and scalable mechanism for test access to embedded reusable cores

Erik Jan Marinissen, R. Arendsen, G. G. J. Bos et al. · 2002 · 344 citations

, , +14

A set of benchmarks for modular testing of SOCs

Erik Jan Marinissen, V. Iyengar, Krishnendu Chakrabarty · 2003 · 306 citations

, , +16

1–5 of 709

Authors

1.8K

  1. EJ
    Erik Jan Marinissen

    IMEC, Belgium

    30 publications · 3.1K citations

    25

    h-index

  2. YZ
    Y. Zorian

    Cirrus Logic (United States), United States

    24 publications · 1.7K citations

    19

    h-index

  3. KC
    Krishnendu Chakrabarty

    Duke University, United States

    23 publications · 2.2K citations

    17

    h-index

  4. AP
    A. Paschalis

    National and Kapodistrian University of Athens, Greece

    13 publications · 592 citations

    13

    h-index

  5. MS
    M. Sonza Reorda

    Politecnico di Torino, Italy

    15 publications · 472 citations

    12

    h-index

1–5 of 1.8K

Institutions

595

  1. Philips (Netherlands)

    Amsterdam, The Netherlands

    21 h-index

    40 publications

    4.9K citations

  2. Duke University

    Durham, United States

    16 h-index

    35 publications

    2.8K citations

  3. Politecnico di Torino

    Turin, Italy

    16 h-index

    98 publications

    2.7K citations

  4. University of Piraeus

    Piraeus, Greece

    13 h-index

    22 publications

    986 citations

  5. University of California San Diego

    San Diego, United States

    13 h-index

    22 publications

    1.4K citations

  6. National and Kapodistrian University of Athens

    Athens, Greece

    12 h-index

    26 publications

    1.1K citations

  7. The University of Texas at Austin

    Austin, United States

    11 h-index

    25 publications

    614 citations

  8. Texas Instruments (United States)

    Dallas, United States

    10 h-index

    14 publications

    516 citations

1–8 of 595

Venues

  1. IEEE Design & Test of Computers

    17 publications · 997 citations

    14

    h-index

  2. 12

    h-index

  3. Journal of Electronic Testing

    JETTA · 7 publications · 632 citations

    10

    h-index

  4. 10

    h-index

  5. IEEE Transactions on Computers

    9 publications · 441 citations

    9

    h-index

1–5