Concepedia

Embedded Testability

Embedded Testability is a methodological framework within embedded instrumentation that integrates self-diagnostic capabilities into system design, enabling autonomous verification and validation of functional correctness during operational phases.

138

Publications

5.3K

Citations

323

Authors

134

Institutions

Publications per year

2017–2026

6

Parents

Publications

138

Testing embedded-core based system chips

Y. Zorian, Erik Jan Marinissen, S. Dey · 2002 · 427 citations

, , +15

Embedded deterministic test for low cost manufacturing test

J. Rajski, Jerzy Tyszer, Mark Kassab et al. · 2003 · 402 citations

, , +13

A structured and scalable mechanism for test access to embedded reusable cores

Erik Jan Marinissen, R. Arendsen, G. G. J. Bos et al. · 2002 · 344 citations

, , +14

Wrapper design for embedded core test

Erik Jan Marinissen, Sandeep Goel, M. Lousberg · 2002 · 224 citations

, , +15

Testing embedded-core-based system chips

Y. Zorian, Erik Jan Marinissen, S. Dey · Computer · 1999 · 208 citations

, , +16

1–5 of 138

Authors

323

  1. YZ
    Y. Zorian

    Cirrus Logic (United States), United States

    13 publications · 1.2K citations

    12

    h-index

  2. EJ
    Erik Jan Marinissen

    IMEC, Belgium

    11 publications · 1.5K citations

    11

    h-index

  3. MS
    M. Sonza Reorda

    Politecnico di Torino, Italy

    7 publications · 147 citations

    7

    h-index

  4. CE
    Charles E. Stroud

    University of Kentucky, United States

    4 publications · 109 citations

    4

    h-index

  5. LW
    L. Whetsel

    Texas Instruments (United States), United States

    4 publications · 349 citations

    4

    h-index

1–5 of 323

Institutions

134

  1. Philips (Netherlands)

    Amsterdam, The Netherlands

    11 h-index

    20 publications

    3.5K citations

  2. Politecnico di Torino

    Turin, Italy

    9 h-index

    32 publications

    728 citations

  3. Advanced Micro Devices (United States)

    Sunnyvale, United States

    5 h-index

    16 publications

    475 citations

  4. Cirrus Logic (United States)

    Austin, United States

    5 h-index

    5 publications

    870 citations

  5. Synopsys (Switzerland)

    Zurich, Switzerland

    4 h-index

    8 publications

    376 citations

  6. Texas Instruments (United States)

    Dallas, United States

    4 h-index

    4 publications

    349 citations

  7. The University of Texas at Austin

    Austin, United States

    4 h-index

    11 publications

    193 citations

  8. University of California San Diego

    San Diego, United States

    4 h-index

    6 publications

    887 citations

1–8 of 134

Venues

  1. IEEE Design & Test of Computers

    5 publications · 245 citations

    5

    h-index

  2. IEEE Transactions on Computers

    3 publications · 91 citations

    3

    h-index

  3. 3

    h-index

  4. Journal of Electronic Testing

    JETTA · 4 publications · 153 citations

    3

    h-index

  5. IEEE Software

    2 publications · 54 citations

    2

    h-index

1–5