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Delaying forever: Uniaxial strained silicon transistors in a 90nm CMOS technology
153
Citations
2
References
2004
Year
Unknown Venue
Electrical EngineeringEngineeringVlsi DesignNanoelectronicsSilicon TransistorsStress-induced Leakage CurrentApplied PhysicsBias Temperature InstabilityCmos TechnologyDevice PhysicsPattern SensitivitySemiconductor Device FabricationSilicon On InsulatorMicroelectronicsUniaxial StrainSemiconductor Device
The study describes the device physics of uniaxial strained silicon transistors. The design examines pattern sensitivity and mobility/Rext partitioning. Uniaxial strain yields higher PMOS drive current (0.72 mA/µm), faster inverter delays (4.6 ps), and enables 50 Mb SRAMs at 0.65 V, while being more effective, less costly, and easier to implement.
We describe the device physics of uniaxial strained silicon transistors. Uniaxial strain is more effective, less costly and easier to implement. The highest PMOS drive current to date is reported: 0.72mA/ /spl mu/m. Pattern sensitivity and mobility/Rext partitioning are discussed. Finally we measure inverter delays as low as 4.6pS, and show 50Mb SRAMs operational at 0.65V.
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