Publication | Open Access
The effect of composition on the bond structure and refractive index of silicon nitride deposited by HWCVD and PECVD
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Citations
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References
2009
Year
Materials ScienceEngineeringOptical PropertiesSilicon On InsulatorApplied PhysicsSemiconductor Device FabricationChemical Vapor DepositionBond StructureOptoelectronicsRefractive IndexCompound Semiconductor
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