Variation tolerant on-chip degradation sensors for dynamic reliability management systems

Circuit Failure Prediction and Its Application to Transistor Aging

Mridul Agarwal, Bipul C. Paul, Ming Zhang et al. · Proceedings - IEEE VLSI Test Symposium/Proceedings of the ... IEEE VLSI Test Symposium · 2007 · 446 citations

Engineering, Computer Engineering, Electrical Engineering +17

The Case for Lifetime Reliability-Aware Microprocessors

Jayanth Srinivasan, Sarita V. Adve, Pradip Bose et al. · ACM SIGARCH Computer Architecture News · 2004 · 378 citations

Engineering, Computer Engineering, Computer Science +15

Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits

Tae-Hyoung Kim, Randy Persaud, Chris H. Kim · IEEE Journal of Solid-State Circuits · 2008 · 260 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +12

Impact of negative bias temperature instability on digital circuit reliability

V. Reddy, A.T. Krishnan, Andrew Marshall et al. · 2003 · 229 citations

Engineering, Computer Engineering, Electrical Engineering +14

The case for lifetime reliability-aware microprocessors

J. Srinivasan, Sarita V. Adve, Pradip Bose et al. · 2004 · 205 citations

Engineering, Computer Engineering, Computer Science +15