IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 2009 · 13 citations · 7 references
EngineeringElectrical EngineeringCircuit TheoryPower ElectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice SimulationElectric CircuitsSmall-signal AnalysisCircuit SimulationEquivalent Circuit AnalysisEquivalent Circuit ModelingRc OscillatorsShort-circuit CurrentSimulation StudiesSmall-signal Device ModelingSmall-signal Equivalent Circuit Models
During Short-Circuit (SC) operations, strong current oscillations of IGBTs can appear. Simulation studies also confirm this. No parasitic inductances are required for such oscillations. A simplified equivalent circuit of the device, which is basically an RC oscillator, is able to reproduce the oscillations. The occurrence of oscillations depends on the model parameters, which can be related to the device structure and other conditions such as the gate resistance value, gate biasing, and DC-link voltage. This paper also shows that application of basic system theory methods to AC small-signal device simulation results (frequency-domain analysis under small-signal conditions) is appropriate to analyze the stability range of the IGBT under Short-Circuit.
7
Vacuum · 1965 · 1.7K citations
Limitation of the short-circuit ruggedness of high-voltage IGBTs
A. Kopta, Munaf Rahimo, U. Schlapbach et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 2009 · 49 citations