IEEE Transactions on Electron Devices · 1999 · 70 citations · 19 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesBipolar Junction TransistorsCurrent-voltage CharacteristicsDevice ModelingDevice SimulationIntegrated Circuit DesignTiming ModelingBipolar Junction Transistor ModelingCircuit SimulationCompact Device ModelingCompact Model Parameter ExtractionCompact ModelingMosfet ModelingParameter ExtractionTransit Frequency
It has been well known for many years that the transit time model used in the SPICE Gummel-Poon model (SGPM) is not adequate for reliable design of circuits operating either at high current densities (including quasi-saturation), which is often the case in high-speed integrated circuits, or at low voltages, which is important for low-power applications. In addition, extraction of the SGPM's transit time model parameters is often very difficult and time consuming. Although various proposals for modeling the transit time were published in the past, most of them are not suited for compact transistor models required in circuit simulation from a numerical, parameter extraction and lateral scaling point of view. In this paper, a set of minority charge and transit time equations is derived which are physics-based and laterally scaleable as well as suitable for incorporation into compact models. Experimental results of the new model are presented in terms of transit time and transit frequency versus bias (I/sub C/, V/sub CE/), geometry, and temperature, showing excellent agreement for different types of silicon homojunction bipolar transistors.
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VBIC95, the vertical bipolar inter-company model
Colin C. McAndrew, J.A. Seitchik, Derek F. Bowers et al. · IEEE Journal of Solid-State Circuits · 1996 · 238 citations
Fundamentals of Semiconductor Devices
Students Quarterly Journal · 1966 · 236 citations