Identification of deep trap levels from thermally stimulated current spectra of semi-insulating CdZnTe detector material

Abstract

Deep trap levels in the semi-insulating (SI) CdZnTe detector material were characterized by simultaneous multiple peak analysis based on thermally stimulated current (TSC) measurements. In our TSCs that have been published previously electron hole pairs were created through the use of proton beam irradiation. Charge carriers were captured in deep traps and afterward released by thermal emission, which was recorded in the 90–300 K range. We showed that the obtained TSC spectra could be well fitted with a unique set of 14 different deep traps, which were all simultaneously and completely characterized. The obtained trap data are in good accordance with earlier deep trap characterizations of the other authors obtained on similar SI CdZnTe materials using different methods.