Concepedia

Publication | Closed Access

Electromigration Cu mass flow in Cu interconnections

DOI

34

Citations

11

References

2005

Year

C.‐K. Hu, D. Canaperi, S.T. Chen, L. Gignac, S. Kaldor, M. Krishnan, S. G. Malhotra, E. Liniger, J. R. Lloyd, D.L. Rath,
Thin Solid Films

References

YearCitations

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