D.L. Rath

An ESCA Study on the Electrochemical Double Layer of Emersed Electrodes

Peter Kolb, D.L. Rath, R.A. Wille et al. · Berichte der Bunsengesellschaft für physikalische Chemie · 1983 · 115 citations

Natural Sciences, Chemistry, Materials Science +17

Comparison of Cu electromigration lifetime in Cu interconnects coated with various caps

C.‐K. Hu, L. Gignac, E. Liniger et al. · Applied Physics Letters · 2003 · 108 citations

Natural Sciences, Electrical Engineering, Materials Science +16

Continuous work function monitoring for electrode emersion

D.L. Rath, D.M. Kolb · Surface Science · 1981 · 91 citations

Engineering, Biomedical Engineering, Electrical Engineering +14

An ESCA study on emersed electrodes

Wilford N. Hansen, D.M. Kolb, D.L. Rath et al. · Journal of Electroanalytical Chemistry · 1980 · 71 citations

Natural Sciences, Electrical Engineering, Electrochemistry +10

Effects of overlayers on electromigration reliability improvement for Cu/low K interconnects

Chunhua Hu, D. Canaperi, S.T. Chen et al. · 2004 · 56 citations

Engineering, Electrical Engineering, Materials Science +16