Solid-State Electronics · 1981 · 36 citations · 22 references
EngineeringElectrical EngineeringRecombinationSemiconductor DevicesSemiconductor MaterialsElectric CircuitsMetal-oxide-semiconductor Field-effect TransistorsSemiconductor ReliabilityShort-channel EffectsDiode Current-voltage CharacteristicsJunction BreakdownNonradiative RecombinationOpen-circuit VoltageRecombination CentersRecombination MechanismsRecombination Processes
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C. J. Tranter · Journal of the Mechanics and Physics of Solids · 1959 · 18.5K citations
Energy gap in Si and Ge: Impurity dependence
G. D. Mahan · Journal of Applied Physics · 1980 · 288 citations