T.W. Ekstedt

Charge accumulation and mobility in thin dielectric MOS transistors

C.G. Sodini, T.W. Ekstedt, J.L. Moll · Solid-State Electronics · 1982 · 313 citations

Electrical Engineering, Engineering, Charge Accumulation +4

Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay

John E. Mahan, T.W. Ekstedt, R. I. Frank et al. · IEEE Transactions on Electron Devices · 1979 · 158 citations

Base Region, Electrical Engineering, Engineering +12

Low Pressure Nitrided‐Oxide as a Thin Gate Dielectric for MOSFET's

S.S. Wong, C.G. Sodini, T.W. Ekstedt et al. · Journal of The Electrochemical Society · 1983 · 72 citations · Full text

Engineering, Auger Analysis, Thin Film Process Technology +17

Characterization of thermally nitrided silicon dioxide

Jun Amano, T.W. Ekstedt · Applied Physics Letters · 1982 · 14 citations

Engineering, Thin Film Process Technology, Silicon On Insulator +18

A JMOS transistor fabricated with 100-Å low-pressure nitrided-oxide gate dielectric

C.G. Sodini, S.S. Wong, T.W. Ekstedt et al. · IEEE Transactions on Electron Devices · 1984 · 10 citations