Concepedia

T.W. Ekstedt

TE

Statistics

Publications

5

Citations

569

H-Index

5

Active since

1979

Affiliations

Hewlett-Packard (United States)(Current)

Massachusetts Institute of Technology

University of California, Berkeley

T.W. Ekstedt is an author at Hewlett-Packard (United States) specializing in engineering, semiconductor materials, and materials science.

Publications per year

1979–1984

5

Publications

5

Charge accumulation and mobility in thin dielectric MOS transistors

C.G. Sodini, T.W. Ekstedt, J.L. Moll · Solid-State Electronics · 1982 · 315 citations

Engineering, Electrical Engineering, Materials Science +14

Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay

John E. Mahan, T.W. Ekstedt, R. I. Frank et al. · IEEE Transactions on Electron Devices · 1979 · 158 citations

Engineering, Electrical Engineering, Materials Science +17

Low Pressure Nitrided‐Oxide as a Thin Gate Dielectric for MOSFET's

S.S. Wong, C.G. Sodini, T.W. Ekstedt et al. · Journal of The Electrochemical Society · 1983 · 72 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Characterization of thermally nitrided silicon dioxide

Jun Amano, T.W. Ekstedt · Applied Physics Letters · 1982 · 14 citations

Engineering, Materials Engineering, Materials Science +17

A JMOS transistor fabricated with 100-&#197; low-pressure nitrided-oxide gate dielectric

C.G. Sodini, S.S. Wong, T.W. Ekstedt et al. · IEEE Transactions on Electron Devices · 1984 · 10 citations

Engineering, Electrical Engineering, Microelectronics +15

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