Concepedia
Statistics
Publications
5
Citations
567
H-Index
Active since
1979
Affiliations
Hewlett-Packard (United States)(Current)
Massachusetts Institute of Technology
University of California, Berkeley
T.W. Ekstedt is an author at Hewlett-Packard (United States) specializing in engineering, applied physics, and microelectronics.
Top concepts
EngineeringApplied PhysicsMicroelectronicsElectrical EngineeringThin FilmsSurface ScienceMaterial ScienceMaterials EngineeringSolar CellsPhotovoltaics
Publications per year
1979–1984
Charge accumulation and mobility in thin dielectric MOS transistors
C.G. Sodini, T.W. Ekstedt, J.L. Moll · Solid-State Electronics · 1982 · 313 citations
Electrical Engineering, Engineering, Charge Accumulation +4
Measurement of minority carrier lifetime in solar cells from photo-induced open-circuit voltage decay
John E. Mahan, T.W. Ekstedt, R. I. Frank et al. · IEEE Transactions on Electron Devices · 1979 · 158 citations
Base Region, Electrical Engineering, Engineering +12
Low Pressure Nitrided‐Oxide as a Thin Gate Dielectric for MOSFET's
S.S. Wong, C.G. Sodini, T.W. Ekstedt et al. · Journal of The Electrochemical Society · 1983 · 72 citations · Full text
Engineering, Auger Analysis, Thin Film Process Technology +17
Characterization of thermally nitrided silicon dioxide
Jun Amano, T.W. Ekstedt · Applied Physics Letters · 1982 · 14 citations
Engineering, Thin Film Process Technology, Silicon On Insulator +18
A JMOS transistor fabricated with 100-Å low-pressure nitrided-oxide gate dielectric
C.G. Sodini, S.S. Wong, T.W. Ekstedt et al. · IEEE Transactions on Electron Devices · 1984 · 10 citations
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