Semiconductor Science and Technology · 1992 · 16 citations · 5 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsHigh-frequency Semiconductor DevicesLight-emitting DiodesOptical Properties Of SemiconductorsRadiative ProcessesWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesBremsstrahlungBremsstrahlung EmissionHot Carrier DynamicsHot Carrier EffectsHot Carrier GenerationLight-emitting DevicesRadiative RecombinationRadiative Transitions
The authors measure the spectrum of radiative emission from a high quality HEMT device and relate this to the energy distribution of the channel electrons. The discussion focuses on the intraband and interband contributions to the spectrum. The intraband, bremsstrahlung component gives evidence for very energetic electrons (Tel approximately=6000 K). The radiative recombination of carriers, however, is characterized by a very much lower temperature.
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A study of photon emission from n-channel MOSFET's
Akira Toriumi, M. Yoshimi, M. Iwase et al. · IEEE Transactions on Electron Devices · 1987 · 173 citations
Electromagnetic radiation from hot carriers in FET-devices
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