Stress characterization of MEMS microbridges by micro-Raman spectroscopy

Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits

Ingrid De Wolf · Semiconductor Science and Technology · 1996 · 957 citations

Engineering, Mechanical Engineering, Integrated Circuits +18

Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors

F. Cerdeira, C.J. Buchenauer, Fred H. Pollak et al. · Physical review. B, Solid state · 1972 · 891 citations

Optical Materials, Engineering, Spectroscopic Property +19

Effect of static uniaxial stress on the Raman spectrum of silicon

E. Anastassakis, A. Pinczuk, E. Burstein et al. · Solid State Communications · 1970 · 597 citations

Materials Science, Engineering, Optical Properties +7

Piezo-Raman measurements and anharmonic parameters in silicon and diamond

E. Anastassakis, A. Cantarero, M. Cardona · Physical review. B, Condensed matter · 1990 · 369 citations

Optical Materials, Engineering, Spectroscopic Property +16

A lattice theory of morphic effects in crystals of the diamond structure

S. Ganesan, A. A. Maradudin, J. Oitmaa · Annals of Physics · 1970 · 243 citations

Materials Science, Diamond-like Carbon, Engineering +9