Journal of Applied Physics · 1987 · 135 citations · 18 references
Natural SciencesMaterials EngineeringMaterials ScienceChemical KineticsPhysical ChemistryPolymer ChemistryEtching ProcessesPlasma-surface InteractionsPolymer Thin FilmsThin Film EtchingThin-film DepositionEtchingFirst-order KineticsParallel-plate ReactorsPlasma DepositionPlasma EtchingPlasma Treatment Of PolymersSelective EtchingSubstrate Temperature Effects
Deposition and etching of thin plasma-polymerized fluorinated monomers have been studied in discharges fed with C2F6-H2 and C2F6-O2 mixtures, respectively. A parallel plate reactor with thermostated electrodes has been utilized for the present study. The experiments have allowed us to ascertain the role of positive ions and of radicals, as well as the effect of pressure and substrate temperature, on the mechanism of deposition. The mechanism of etching has also been investigated, and it has been found that both O and F atoms contribute to the process through overall first-order kinetics. Conditions for a selective etching of noncross-linked films with respect to cross-linked ones have also been found.
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