Impurity ionization in MOSFETs at very low temperatures

Physics of Semiconductor Devices

Samarth Jain, S. Radhakrishna · 1987 · 4.2K citations

Engineering, Electrical Engineering, Physics +12

Deep-level transient spectroscopy: A new method to characterize traps in semiconductors

D. V. Lang · Journal of Applied Physics · 1974 · 3.7K citations

Engineering, Electrical Engineering, Materials Science +16

On Pre-Breakdown Phenomena in Insulators and Electronic Semi-Conductors

J. Frenkel · Physical Review · 1938 · 2K citations

Natural Sciences, Materials Science, Physics +14

Direct Observation of Ballistic Transport in GaAs

M. Heiblum, M. I. Nathan, D. Thomas et al. · Physical Review Letters · 1985 · 436 citations

Engineering, Electrical Engineering, Physics +17

Operation of bulk CMOS devices at very low temperatures

H. Hanamura, Masashi Aoki, T. Masuhara et al. · IEEE Journal of Solid-State Circuits · 1986 · 101 citations

Engineering, Computer Engineering, Electrical Engineering +14