Applied Physics Express · 2010 · 61 citations · 6 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsField-effect TransistorsNanoelectronicsSemiconductor Device MaterialsSemiconductor HeterostructuresWide Band Gap SemiconductorsWide-bandgap SemiconductorsBreakdown VoltageGallium Nitride (Gan) MaterialsGate Oxide Thickness EffectsHeterostructure TransistorsHigh-voltage BreakdownNear-threshold VoltageThreshold Voltage
Novel vertical heterojunction field-effect transistors (VHFETs) with re-grown AlGaN/GaN two-dimensional electron gas (2DEG) channels on free-standing GaN substrates have been developed. The VHFETs exhibited a specific on-resistance (RonA) of 7.6 mΩ cm2 at a threshold voltage (VTH) of -1.1 V and a breakdown voltage (VB) of 672 V. The breakdown voltage and the figure of merit (VB2/RonA) are the highest among those of the GaN-based vertical transistors ever reported. It was demonstrated that the threshold voltage can be controlled by the thickness of AlGaN layers and a normally-off operation was achieved with a 10-nm-thick Al0.2Ga0.8N layer.
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Dislocation reduction in GaN crystal by advanced-DEEP
Kensaku Motoki, Takuji Okahisa, Ryu Hirota et al. · Journal of Crystal Growth · 2007 · 122 citations