Electron transport through broken down ultra-thin SiO2 layers in MOS devices

Electronic processes in non-crystalline materials

A.K. Jonscher · Thin Solid Films · 1972 · 4K citations

Natural Sciences, Materials Science, Physics +12

<i>Advances in Electronics and Electron Physics</i>

L. Marton, Robert L. Sproull · Physics Today · 1960 · 1.8K citations

Natural Sciences, Electrical Engineering, Physics +13

New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

R. Degraeve, G. Groeseneken, R. Bellens et al. · IEEE Transactions on Electron Devices · 1998 · 644 citations

Engineering, Electrical Engineering, Materials Science +17

Trap creation in silicon dioxide produced by hot electrons

D. J. DiMaria, J. Stasiak · Journal of Applied Physics · 1989 · 615 citations

Natural Sciences, Materials Science, Physics +17

Quantized transmission of a saddle-point constriction

Physical review. B, Condensed matter · 1990 · 601 citations

Natural Sciences, Physics, Condensed Matter Physics +3