Electromigration in thin silver, copper, gold, indium, tin, lead and magnesium films

Electromigration—A brief survey and some recent results

J. R. Black · IEEE Transactions on Electron Devices · 1969 · 1.5K citations

Engineering, Electrical Engineering, Materials Science +17

Reduction of Electromigration in Aluminum Films by Copper Doping

I. Ames, F. M. d’Heurle, R. E. Horstmann · IBM Journal of Research and Development · 1970 · 301 citations

Natural Sciences, Materials Engineering, Materials Science +17

Electromigration Damage in Aluminum Film Conductors

M. J. Attardo, R. Rosenberg · Journal of Applied Physics · 1970 · 264 citations

Natural Sciences, Materials Engineering, Materials Science +16

Electromigration in Thin Al Films

I. A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1969 · 188 citations

Natural Sciences, Materials Engineering, Materials Science +12

RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS

R. Rosenberg, L. Berenbaum · Applied Physics Letters · 1968 · 154 citations

Natural Sciences, Materials Engineering, Materials Science +17