Solid-State Electronics · 2003 · 22 citations · 27 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsMaterials PhysicsThin FilmsAmorphous Electronic MaterialsAmorphous MaterialsAmorphous SemiconductorsAmorphous SolidsOptical Properties Of SemiconductorsSemiconductor PhysicsAmorphous SiliconAmorphous Thin FilmsElectronic Density Of StatesSemiconductor CharacterizationTrap CharacterizationTrap MechanismsTrap State Analysis
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Electronic processes in non-crystalline materials
A.K. Jonscher · Thin Solid Films · 1972 · 4K citations
NROM: A novel localized trapping, 2-bit nonvolatile memory cell
B. Eitan, Paolo Pavan, I. Bloom et al. · IEEE Electron Device Letters · 2000 · 547 citations · Full text
Engineering, Computer Engineering, Electrical Engineering +12