Statistics
Publications
4
Citations
84
H-Index
4
Active since
2002
Affiliations
M. Naich is an author at Tel Aviv University specializing in materials science, trap characterization, and physics.
Publications per year
2002–2004
4
4
Exoelectron emission spectroscopy of silicon nitride thin films
G. Rosenman, M. Naich, M. Molotskii et al. · Applied Physics Letters · 2002 · 22 citations
Exoelectron emission studies of trap spectrum in ultrathin amorphous Si3N4 films
M. Naich, G. Rosenman, Ya. Roizin et al. · Solid-State Electronics · 2003 · 22 citations
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