Japanese Journal of Applied Physics · 2002 · 30 citations · 21 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsSurface ScienceThin FilmsAtomic Layer DepositionCoatingsOptical Properties Of SolidsOptical Thin FilmsThin Film Optical PropertiesThin-film MaterialsAmorphous Thin FilmsDamage ThresholdsFilm ThicknessLow-temperature GrowthOptical AbsorptionOptical CoatingsOptical Thin Film CoatingsThickness Distribution
We prepared optical thin films using an atomic layer deposition (ALD) procedure in order to apply this coating method to optical components for high-power and large-scale lasers. Film thickness shows a proportional relationship to the number of operation cycles even in the case of room-temperature growth, and the distribution is uniform with a thickness error of less than 1% over an area of 240 mm diameter. We examined the laser damage thresholds of the films with 1 ns laser pulses at 1.064 µm. The highest thresholds (TiO 2 : 5 J/cm 2 , Al 2 O 3 : 5.2 J/cm 2 ) are obtained in the amorphous films grown at low growth temperatures (25–50°C). Results from the analysis of film structure and composition, and measurement of optical absorption reveal that the decrease in laser damage threshold as the growth temperature rises is caused by the crystallization of films.
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Atomic Layer Deposition of Oxide Thin Films with Metal Alkoxides as Oxygen Sources
Mikko Ritala, Kaupo Kukli, Antti Rahtu et al. · Science · 2000 · 483 citations
Natural Sciences, Materials Engineering, Materials Science +17
Growth of titanium dioxide thin films by atomic layer epitaxy
Mikko Ritala, Markku Leskelä, E. Nykänen et al. · Thin Solid Films · 1993 · 307 citations
Natural Sciences, Materials Engineering, Materials Science +14