Concepedia

Publication | Closed Access

Comparison of secondary electron emission in helium ion microscope with gallium ion and electron microscopes

DOI

37

Citations

9

References

2008

Year

K. Ohya, T. Yamanaka, K. Inai, T. Ishitani
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

References

YearCitations

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