Bill Ward - Concepedia

Author

Bill Ward

Carl Zeiss (United States)

Also Known As

B Ward, B. W. Ward, Bill W. Ward, Bill Ward

Publications

829

Citations

H-Index

Concepts

All Affiliations

Carl Zeiss (United States)

About

Bill Ward is an author at Carl Zeiss (United States) specializing in engineering, applied physics, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	9	9	821
2	Applied Physics	8	8	785
3	Natural Sciences	4	4	618
4	Medicine	2	2	131
5	Computer Engineering	1	1	36

Bill Ward

Publications

821

Citations

H-Index

Page 1

	Year	Citations
Helium ion microscope: A new tool for nanoscale microscopy and metrology Bill Ward, John Notte, N. P. Economou Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena High ResolutionEngineeringMicroscopyNew ToolIon Beam Instrumentation	2006	412
An Introduction to the Helium Ion Microscope John Morgan, John Notte, Raymond Hill, Microscopy Today High Resolution ImagesEngineeringPhysicsMicroscopyNatural Sciences	2006	139
An Introduction to the Helium Ion Microscope John Notte, Bill Ward, Nick Economou, AIP conference proceedings EngineeringMicroscopyIon Beam InstrumentationElectron Cloud EffectsHelium Atoms	2007	76
The ALIS He ion source and its application to high resolution microscopy Raymond Hill, John Notte, Bill Ward Physics Procedia EngineeringMicroscopyMechanical EngineeringElectron MicroscopyGrow Fatigue Cracks	2008	55
Integrated circuit diagnosis using focused ion beams David C. Shaver, Bill Ward Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena Electrical EngineeringIon ImplantationEngineeringElectronic InstrumentationVoltage Contrast	1986	36
An Introduction to Helium Ion Microscopy John Notte, R. Hill, Shawn McVey, Microscopy and Microanalysis – August 3EngineeringPhysicsMicroscopyMicroanalysis 2006	2006	34
Elemental analysis with the helium ion microscope Sybren Sijbrandij, Bill Thompson, John Notte, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringElectron MicroscopyPhysicsMicroscopyNatural Sciences	2008	33
Focused ion-beam crater arrays for induced nucleation of diamond film A. R. Kirkpatrick, Bill Ward, N. P. Economou Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena Materials ScienceMaterials EngineeringDiamond FilmIon ImplantationEffective Nucleation Sites	1989	25
Advances In Focused-Ion-Beam Repair Techniques N. P. Economou, David C. Shaver, Bill Ward Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Ion ImplantationRepair ApplicationsEngineeringElectron-beam LithographyMicroscopy	1987	11

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