IEEE Design & Test of Computers · 1999 · 10 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSystem-on-chip DesignDesign For TestabilityDevice CharacterizationDevice ReliabilityIntegrated Circuit DesignReliabilitySemiconductor ReliabilityCmos ReliabilityElectromigration ReliabilityHardware Reliability AnalysisInterconnect ReliabilityInterconnect Testing
International audience