Interconnect Testing

Interconnect Testing is a systematic methodology within interconnect technology that verifies and validates the electrical, physical, and functional integrity of interconnections in integrated circuits and packaging through targeted stimulation, measurement, and analysis to detect manufacturing defects, performance deviations, and reliability risks.

307

Publications

9.4K

Citations

862

Authors

249

Institutions

Publications per year

2017–2026

Parents

Interconnect Technology

Publications

307

Test Challenges for 3D Integrated Circuits

Hsien-Hsin S. Lee, Krishnendu Chakrabarty · IEEE Design & Test of Computers · 2009 · 311 citations

Engineering, Computer Engineering, Manufacturing Engineering +16

Fault modeling and simulation for crosstalk in system-on-chip interconnects

Michael Cuviello, Sujit Dey, Xiaoliang Bai et al. · International Conference on Computer Aided Design · 1999 · 192 citations

Engineering, Computer Engineering, Electrical Engineering +17

A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects

N. Jarwala, C.W. Yau · 2003 · 169 citations

Engineering, Computer Engineering, Electrical Engineering +17

Fault modeling and simulation for crosstalk in system-on-chip interconnects

Michael Cuviello, S. Dey, Xiaoliang Bai et al. · 1999 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (Cat. No.99CH37051) · 2003 · 162 citations

Engineering, Computer Engineering, Electrical Engineering +17

Testing the interconnect of RAM-based FPGAs

M. Renovell, J.M. Portal, Joan Figueras et al. · IEEE Design & Test of Computers · 1998 · 159 citations

Engineering, Computer Engineering, Computer Science +15

1–5 of 307

Authors

862

EJ
Erik Jan Marinissen
IMEC, Belgium
16 publications · 706 citations
16
h-index
KC
Krishnendu Chakrabarty
Duke University, United States
11 publications · 504 citations
10
h-index
MB
Mehdi B. Tahoori
Karlsruhe Institute of Technology, Germany
9 publications · 256 citations
9
h-index
MR
M. Renovell
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
8 publications · 362 citations
8
h-index
WC
Wu-Tung Cheng
Mentor Technologies, United States
7 publications · 223 citations
7
h-index

1–5 of 862

Institutions

249

1–8 of 249

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
23 publications · 664 citations
17
h-index
Microelectronics Reliability
10 publications · 231 citations
10
h-index
Journal of Electronic Testing
JETTA · 9 publications · 182 citations
9
h-index
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
8 publications · 189 citations
8
h-index
IEEE Transactions on Instrumentation and Measurement
6 publications · 99 citations
6
h-index

1–5