Concepedia

Publication | Closed Access

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue

DOI

13

Citations

3

References

2005

Year

Benjamin Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J.M. Dorkel, Jean-Pierre Fradin
Microelectronics Reliability

References

YearCitations

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