Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue

Benjamin Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J.M. Dorkel, Jean-Pierre Fradin

Microelectronics Reliability · 2005 · 13 citations · 3 references

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