Concepedia

Power Device Reliability

Power Device Reliability is a performance metric that quantifies the ability of semiconductor power devices to consistently perform their designated electrical functions under specified conditions over time without degradation or failure, distinguishing it from related metrics by focusing specifically on the operational lifespan and failure mechanisms of power electronic components in electric vehicle applications.

613

Publications

31.4K

Citations

2.1K

Authors

558

Institutions

Publications per year

2017–2026

225

Parents

Publications

613

An Industry-Based Survey of Reliability in Power Electronic Converters

Shaoyong Yang, A.T. Bryant, Philip Mawby et al. · IEEE Transactions on Industry Applications · 2011 · 1.9K citations · Full text

, , +16

GaN-on-Si Power Technology: Devices and Applications

Kevin J. Chen, Oliver D. Häberlen, Alex Lidow et al. · IEEE Transactions on Electron Devices · 2017 · 1.6K citations

, , +17

Selected failure mechanisms of modern power modules

Mauro Ciappa · Microelectronics Reliability · 2002 · 969 citations

, , +13

Toward Reliable Power Electronics: Challenges, Design Tools, and Opportunities

Huai Wang, Marco Liserre, Frede Blaabjerg · IEEE Industrial Electronics Magazine · 2013 · 884 citations · Full text

, , +16

Fast power cycling test of IGBT modules in traction application

Martin Held, P. Jacob, G. Nicoletti et al. · 2002 · 565 citations

, , +15

1–5 of 613

Authors

2.1K

  1. FB
    Frede Blaabjerg

    Aalborg University, Denmark

    48 publications · 3.9K citations

    25

    h-index

  2. HW
    Huai Wang

    Aalborg University, Denmark

    18 publications · 1.8K citations

    16

    h-index

  3. FI
    Francesco Iannuzzo

    Aalborg University, Denmark

    14 publications · 500 citations

    13

    h-index

  4. AC
    Alberto Castellazzi

    University of Nottingham, United Kingdom

    11 publications · 296 citations

    10

    h-index

  5. JL
    Josef Lutz

    Chemnitz University of Technology, Germany

    10 publications · 795 citations

    10

    h-index

1–5 of 2.1K

Institutions

558

  1. Aalborg University

    Aalborg, Denmark

    29 h-index

    191 publications

    12.1K citations

  2. Centre National de la Recherche Scientifique

    Paris, France

    13 h-index

    38 publications

    920 citations

  3. Infineon Technologies (Germany)

    Munich, Germany

    13 h-index

    25 publications

    1.9K citations

  4. DEVCOM Army Research Laboratory

    Adelphi, United States

    11 h-index

    27 publications

    2.5K citations

  5. Texas Instruments (United States)

    Dallas, United States

    11 h-index

    24 publications

    1.2K citations

  6. Virginia Tech

    Blacksburg, United States

    11 h-index

    41 publications

    1.6K citations

  7. University of Nottingham

    Nottingham, United Kingdom

    10 h-index

    31 publications

    1.1K citations

  8. Chongqing University

    Chongqing, China

    10 h-index

    35 publications

    1.1K citations

1–8 of 558

Venues

  1. IEEE Transactions on Power Electronics

    38 publications · 3.8K citations

    28

    h-index

  2. Microelectronics Reliability

    70 publications · 3.5K citations

    27

    h-index

  3. IEEE Transactions on Electron Devices

    26 publications · 2.9K citations

    19

    h-index

  4. IEEE Transactions on Industry Applications

    17 publications · 3.1K citations

    14

    h-index

  5. Materials science forum

    MSF · Book series · 14 publications · 364 citations

    12

    h-index

1–5