Ph. Dupuy - Concepedia

Author

Ph. Dupuy

Centre National de la Recherche Scientifique

Also Known As

P Dupuy, P. A. Dupuy, P. Dupuy, Ph. Dupuy

Publications

248

Citations

H-Index

Concepts

All Affiliations

Centre National de la Recherche Scientifique Université Fédérale de Toulouse Midi-Pyrénées Laboratoire d'Analyse et d'Architecture des Systèmes Centre d’Élaboration de Matériaux et d’Études Structurales Motorola (United States)

About

Ph. Dupuy is an author at Centre National de la Recherche Scientifique specializing in electrical engineering, engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	203
2	Electrical Engineering	10	10	203
3	Microelectronics	7	7	135
4	Computer Engineering	2	2	40
5	Mechanics Of Materials	1	1	14

Ph. Dupuy

Publications

203

Citations

H-Index

Page 1

	Year	Citations
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue Donatien Martineau, T. Mazeaud, M. Legros, Microelectronics Reliability Electrical EngineeringEngineeringPower DeviceBias Temperature InstabilityCircuit Reliability	2010	28
Characterization and modelling of ageing failures on power MOSFET devices Benjamin Khong, M. Legros, P. Tounsi, Microelectronics Reliability ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2007	28
Power module lifetime estimation from chip temperature direct measurement in an automotive traction inverter G. Coquery, S. Carubelli, J.P. Ousten, Microelectronics Reliability Electrical EngineeringEngineeringHardware ReliabilityComputer EngineeringAutomotive Traction Inverter	2001	27
Clamped inductive switching of LDMOST for smart power IC's D. Farenc, G. Charitat, Ph. Dupuy, Electrical EngineeringEnergy HarvestingEngineeringPower IcPower Device	2002	27
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies Donatien Martineau, T. Mazeaud, M. Legros, Microelectronics Reliability Electrical EngineeringEngineeringHardware ReliabilityNanoelectronicsBias Temperature Instability	2009	26
Energy capability of lateral and vertical DMOS transistors in an advanced automotive smart power technology S. Merchant, Richard A. Baird, Paul N. Bennett, EngineeringThermal FailureVertical Dmos TransistorsUpdrain TmosPower Electronics	2002	18
3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs T. Azoui, P. Tounsi, Ph. Dupuy, Microelectronics Reliability Electrical EngineeringReliability EngineeringEngineeringHardware ReliabilityMetallization Ageing Effects	2011	14
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue Benjamin Khong, P. Tounsi, Ph. Dupuy, Microelectronics Reliability ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware Reliability	2005	13
Numerical and experimental results correlation during power MOSFET ageing T. Azoui, P. Tounsi, Ph. Dupuy, Device ModelingVertical Power MosfetElectrical EngineeringPower Mosfet AgeingEngineering	2012	11
In-depth investigation of metallization aging in power MOSFETs Roberta Ruffilli, Mounira Berkani, Ph. Dupuy, Microelectronics Reliability Electrical EngineeringEngineeringCorrosionBias Temperature InstabilityCircuit Reliability	2015	11

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