Characterization of ageing failures on power MOSFET devices by electron and ion microscopies - Concepedia

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Characterization of ageing failures on power MOSFET devices by electron and ion microscopies

26

Citations

9

References

2009

Year

Donatien Martineau, T. Mazeaud, M. Legros, Ph. Dupuy, C. Levade, G. Vanderschaeve

Microelectronics Reliability

Electrical EngineeringEngineeringHardware ReliabilityNanoelectronicsBias Temperature InstabilityTime-dependent Dielectric BreakdownIon MicroscopiesCircuit ReliabilityDevice ReliabilityMicroelectronicsElectrical InsulationPower Mosfet Devices

References

	Year	Citations

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