Concepedia

Publication | Closed Access

Characterization and modelling of ageing failures on power MOSFET devices

DOI

28

Citations

10

References

2007

Year

Benjamin Khong, M. Legros, P. Tounsi, Ph. Dupuy, X. Chauffleur, C. Levade, G. Vanderschaeve, E. Scheid
Microelectronics Reliability

References

YearCitations

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