Statistics
Publications
2
Citations
41
H-Index
2
Active since
2005
Benjamin Khong is an author at Laboratoire d'Analyse et d'Architecture des Systèmes specializing in power device reliability, device reliability, and device characterization.
Publications per year
2005–2007
2
2
Characterization and modelling of ageing failures on power MOSFET devices
Benjamin Khong, M. Legros, P. Tounsi et al. · Microelectronics Reliability · 2007 · 28 citations
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